The growth mode and microstructure of Ag-doped YBa2Cu3O7-delta thin films prepared by dual beam pulsed-laser deposition

Citation
Sy. Xu et al., The growth mode and microstructure of Ag-doped YBa2Cu3O7-delta thin films prepared by dual beam pulsed-laser deposition, PHYSICA C, 341, 2000, pp. 2345-2346
Citations number
6
Categorie Soggetti
Apllied Physucs/Condensed Matter/Materiales Science
Journal title
PHYSICA C
ISSN journal
09214534 → ACNP
Volume
341
Year of publication
2000
Part
4
Pages
2345 - 2346
Database
ISI
SICI code
0921-4534(200011)341:<2345:TGMAMO>2.0.ZU;2-#
Abstract
Ag-doped c-axis YBa2Cu3O7-delta thin films were fabricated by using dual-be am pulsed-laser deposition. When a small amount of silver was doped in the film grown at 700 degreesC, the J(c) value was obviously enhanced. The temp erature dependence of J(c) was found proportional to (1-T/T-c0)(3/2) at T c lose to T-c0. In the films grown at 730 degreesC, we observed long bar-like structures with lengths in tens of mum, oriented along or at 45 degrees to the a/b axes of the film. The bars consisted mainly a-axis YBCO grains and a mixture of polycrystalline and amorphous oxides. Defects on substrate su rface and growth temperature were found dominating in formation of the bars , which could be attributed to a Ag-assisted diffusion mechanism during the deposition process.