Effects of the interaction of YBCO thin film and substrates on the qualityof the film

YBCO thin films grown on SrTiO3, yttria-stabilized zirconia (YSZ), and YSZ with CeO2 buffer layer, by pulsed laser deposition, were studied by high re solution x-ray diffraction, including Rocking curve, and Phi-scan. It is sh own that the distortion of the thin films is different in the different sub strates. The careful calculation of the cohesive energy of the thin films a nd substrates, especially considering the effect of the interaction of the YBCO and substrates, indicates there is a close relationship between the co hesive energy and the distortion of the films. Using it to explain the dist ortion is better than using mismatch.