Microwave properties of YBCO films deposited on in-plane textured CeO2/YSZbuffer layers

Authors
Kawagishi, K Komori, K Arisawa, S Fukutomi, M Togano, K
Citation
K. Kawagishi et al., Microwave properties of YBCO films deposited on in-plane textured CeO2/YSZbuffer layers, PHYSICA C, 341, 2000, pp. 2405-2406
Citations number
2
Categorie Soggetti
Apllied Physucs/Condensed Matter/Materiales Science
Journal title
PHYSICA C
ISSN journal
09214534 → ACNP
Volume
341
Year of publication
2000
Part
4
Pages
2405 - 2406
Database
ISI
SICI code
0921-4534(200011)341:<2405:MPOYFD>2.0.ZU;2-U
Abstract
Yttria-stabilized zirconia (YSZ) and CeO2 buffer layers were used on MgO su bstrates to control the in-plane epitaxy of YBCO films. Substrate temperatu re control method in RF magnetron sputtering deposition was improved and th e deposition was performed in good reproducibility. XRD results revealed an excellent in-plane epitaxy with no evidence of misoriented grains in a YBC O/CeO2/YSZ/MgO structure.