Intermediate phase formation during Hg-2212 synthesis by in-situ X-ray synchrotron diffraction

Citation
P. Toulemonde et al., Intermediate phase formation during Hg-2212 synthesis by in-situ X-ray synchrotron diffraction, PHYSICA C, 341, 2000, pp. 2457-2458
Citations number
1
Categorie Soggetti
Apllied Physucs/Condensed Matter/Materiales Science
Journal title
PHYSICA C
ISSN journal
09214534 → ACNP
Volume
341
Year of publication
2000
Part
4
Pages
2457 - 2458
Database
ISI
SICI code
0921-4534(200011)341:<2457:IPFDHS>2.0.ZU;2-5
Abstract
The synthesis of Hg2Ba2YCu2O8-delta (Hg-2212) requires a high pressure - hi gh temperature process. The determination of the reaction path is an import ant piece of information for its optimization. In-situ X-ray diffraction at high pressure-high temperature has been performed tot monitor this process by using the synchrotron source of ESRF (Grenoble-France, ID30 beam line). The synthesis was followed at 4 GPa from room temperature to 850 degreesC. When the starting powder is a mixture of oxides (BaO2, YzO(3), CuO) and Cu, a transient oxide phase composed at least of Pa and Hg is formed that is t hen converted into the final Hg-2212 product. Conversely no intermediate ph ase can be detected when a pre-reacted precursor "Ba(2)YCu(2)Oy" mixed with HgO is used.