Superconducting and structural properties of YBCO thick films grown on biaxially oriented CeO2/NiO/Ni-V architecture

Citation
G. Celentano et al., Superconducting and structural properties of YBCO thick films grown on biaxially oriented CeO2/NiO/Ni-V architecture, PHYSICA C, 341, 2000, pp. 2501-2502
Citations number
9
Categorie Soggetti
Apllied Physucs/Condensed Matter/Materiales Science
Journal title
PHYSICA C
ISSN journal
09214534 → ACNP
Volume
341
Year of publication
2000
Part
4
Pages
2501 - 2502
Database
ISI
SICI code
0921-4534(200011)341:<2501:SASPOY>2.0.ZU;2-N
Abstract
Biaxially aligned YBa2Cu3O7-y thick films were obtained by Pulsed Laser Dep osition on cube textured nonmagnetic Ni-V metallic substrates, with NiO as a first buffer layer. The critical temperature and critical current density at 77K and self field of the YBCO thick film grown on an expitaxial CeO2/N iO buffer layer architecture are 90.5K and 0.6 MA/cm(2), respectively.