Transport measurements on individual CuO2 double layers

Citation
M. Mossle et al., Transport measurements on individual CuO2 double layers, PHYSICA C, 341, 2000, pp. 1571-1572
Citations number
3
Categorie Soggetti
Apllied Physucs/Condensed Matter/Materiales Science
Journal title
PHYSICA C
ISSN journal
09214534 → ACNP
Volume
341
Year of publication
2000
Part
3
Pages
1571 - 1572
Database
ISI
SICI code
0921-4534(200011)341:<1571:TMOICD>2.0.ZU;2-V
Abstract
Oxygen loss at the surface of Bi2Sr2CaCu2O8+x single crystals provides CuO2 layers with different critical temperatures. Particularly for overdoped cr ystals this allows to achieve a T-c maximum near the surface. We performed transport measurements of this oxygen depleted layer. Samples were prepared by evaporating four Pb or Ag electrodes on top of freshly cleaved Bi2Sr2Ca Cu2O8+x single crystals. Using overdoped crystals with a bulk T-c of 55 to 60 K, the outermost layer was found to be underdoped with T-c down to 30 K while the adjacent one was near optimal doping with T-c between 80 and 90 K . The T-c of the third layer was close to the bulk value. For temperatures above the bulk T-c often only one CuO2 double layer was found to be superco nducting. We discuss current transport measurements with current flow along the CuO2 layers.