Observation of a trap effect in N/SNS/N structure

Authors
Wei, J Hou, YM Song, PC Chen, ML Wu, K Yan, SS
Citation
J. Wei et al., Observation of a trap effect in N/SNS/N structure, PHYSICA C, 341, 2000, pp. 1591-1592
Citations number
4
Categorie Soggetti
Apllied Physucs/Condensed Matter/Materiales Science
Journal title
PHYSICA C
ISSN journal
09214534 → ACNP
Volume
341
Year of publication
2000
Part
3
Pages
1591 - 1592
Database
ISI
SICI code
0921-4534(200011)341:<1591:OOATEI>2.0.ZU;2-P
Abstract
The dV/dI-V curve of Cu/Nb-Cu-Nb/Cu structure with superconductor/normal me tal (S/N) interface parallel the current was measured at liquid helium temp erature. Resistance rapidly regains and shows a step like feature when the bias is lowered than Delta (Nb)/e. This result can't be explained by conven tional theory. A trap effect due to Andreev reflection is proposed to inter pret the result.