Atomic force microscopy with a conducting tip: correlation studies betweenmicrostructure and electrical properties of YBaCuO thin films

Authors
Degardin, AF Schneegans, O Houze, F Caristan, E De Luca, A Chretien, P Boyer, L Kreisler, AJ
Citation
Af. Degardin et al., Atomic force microscopy with a conducting tip: correlation studies betweenmicrostructure and electrical properties of YBaCuO thin films, PHYSICA C, 341, 2000, pp. 1965-1968
Citations number
6
Categorie Soggetti
Apllied Physucs/Condensed Matter/Materiales Science
Journal title
PHYSICA C
ISSN journal
09214534 → ACNP
Volume
341
Year of publication
2000
Part
3
Pages
1965 - 1968
Database
ISI
SICI code
0921-4534(200011)341:<1965:AFMWAC>2.0.ZU;2-V
Abstract
Topographical and local electrical contact resistance images on surfaces of YBaCuO thin films sputtered onto MgO and SrTiO3 substrates have been obtai ned by AFM using a conducting tip. Typical growth exhibiting terraces of on e unit cell height has been observed. Moreover, electrical images have clea rly revealed electrically connected areas between grains, which can be corr elated to electrical transport properties of the films.