YBa2Cu3Ox (YBCO) thin films were deposited by the pulsed-laser ablation on
polycrystalline Ag substrates. The c-axis-oriented YBCO films on various hi
gh-index silver crystal planes have been observed using cross-sectional tra
nsmission electron microscopy (TEM). The obtained results show that, differ
ing from the epitaxial growth of the YBCO films on low-index planes, the YB
CO films grown on high-index planes have not a good epitaxial relationship.
The c-axes of the YBCO grains keep to vertical to the substrate surface pl
ane but the a-and b- axes of the grains are randomly oriented.