Normal state resistivity of underdoped YBa2Cu3O7-d films and La2-xSrxCuO4 ultra-thin films in fields up to 60 T

Citation
L. Trappeniers et al., Normal state resistivity of underdoped YBa2Cu3O7-d films and La2-xSrxCuO4 ultra-thin films in fields up to 60 T, PHYSICA C, 341, 2000, pp. 903-904
Citations number
7
Categorie Soggetti
Apllied Physucs/Condensed Matter/Materiales Science
Journal title
PHYSICA C
ISSN journal
09214534 → ACNP
Volume
341
Year of publication
2000
Part
2
Pages
903 - 904
Database
ISI
SICI code
0921-4534(200011)341:<903:NSROUY>2.0.ZU;2-#
Abstract
We present the normal-state resistance of La2-xSrxCuO4 thin films under epi taxial strain, measured below T-c by applying pulsed fields up to 60 T. We compare these data with earlier data on YBa2Cu3Ox thin firms in the underdo ped regime. The data are analyzed in terms of the recently proposed 1D quan tum transport model and charge-stripe models. The high field data have been used to identify the new regimes and dimensional crossovers caused by the formation of stripes and their interplay with disorder.