Correlation between Tc, in-plane Cu-O-Cu bond length, and buckling of the CuO2 plane in cuprate superconductors

Authors
Citation
S. Kambe et O. Ishii, Correlation between Tc, in-plane Cu-O-Cu bond length, and buckling of the CuO2 plane in cuprate superconductors, PHYSICA C, 341, 2000, pp. 555-556
Citations number
11
Categorie Soggetti
Apllied Physucs/Condensed Matter/Materiales Science
Journal title
PHYSICA C
ISSN journal
09214534 → ACNP
Volume
341
Year of publication
2000
Part
1
Pages
555 - 556
Database
ISI
SICI code
0921-4534(200011)341:<555:CBTICB>2.0.ZU;2-3
Abstract
Correlation between transition temperature, in-plane copper-oxygen-copper b ond length and buckling of the CuO2 plane in optimally doped copper oxide s uperconductors was investigated. As for cuprates with double CuO2 layers, a ll the compounds had buckling type distortion in a CuO5 pyramid. The degree of distortion was determined only by a kind of cation between the two faci ng CuO5 pyramids, that is, calcium or yttrium. A higher transition temperat ure was obtained for a copper oxide with having larger Cu-O-Cu length and s maller buckling degree.