Improved X-ray powder diffraction data for Ti2AlN

Citation
My. Gamarnik et al., Improved X-ray powder diffraction data for Ti2AlN, POWDER DIFF, 15(4), 2000, pp. 241-242
Citations number
7
Categorie Soggetti
Apllied Physucs/Condensed Matter/Materiales Science
Journal title
POWDER DIFFRACTION
ISSN journal
08857156 → ACNP
Volume
15
Issue
4
Year of publication
2000
Pages
241 - 242
Database
ISI
SICI code
0885-7156(200012)15:4<241:IXPDDF>2.0.ZU;2-X
Abstract
A complete set of d spacings, intensities, and h, k, l indexes for Ti2AlN h as been determined from;Y-ray powder diffraction. The lattice parameters ar e a=2.989(2) Angstrom, c=13.614(5) Angstrom; in good agreement with previou s work. The new set of results comprises seven reflections not present in t he current Ti2AlN PDF card No. 18-70. Furthermore, a new set of relative in tensities are reported that are in better agreement with the calculated val ues than they are with those listed in the PDF card. (C) 2000 International Centre for Diffraction Data. [S0885-7156(00)00603-5].