Threshold characteristics of InGaAsP/InP multiple quantum well lasers

Citation
Lv. Asryan et al., Threshold characteristics of InGaAsP/InP multiple quantum well lasers, SEMIC SCI T, 15(12), 2000, pp. 1131-1140
Citations number
26
Categorie Soggetti
Apllied Physucs/Condensed Matter/Materiales Science
Journal title
SEMICONDUCTOR SCIENCE AND TECHNOLOGY
ISSN journal
02681242 → ACNP
Volume
15
Issue
12
Year of publication
2000
Pages
1131 - 1140
Database
ISI
SICI code
0268-1242(200012)15:12<1131:TCOIMQ>2.0.ZU;2-N
Abstract
A theoretical analysis and computer simulation of the threshold current den sity j(th) and characteristic temperature T-0 of multiple quantum well lase rs (MQWLs) are presented. Together with the spontaneous radiative recombina tion, the Auger recombination and the lateral diffusive leakage of carriers from the active region are included into the model. A first-principle calc ulation of the: Auger recombination current is performed. It is shown that the lateral diffusive leakage current is controlled by the radiative and Au ger currents. When calculating the carrier densities, the electrons in the barrier regions are properly taken into account. Redistribution of electron s over the active region is shown to increase the threshold current conside rably. The dependences of jth and To on temperature, number of QWs, cavity length and lateral size are discussed in detail. The effect of lattice and carrier heating on j(th) and T-0 is investigated and shown to be essential at high temperature.