Fabrication of La1-xSrxGa1-yMgyO3-(x plus y)/2 thin films by pulsed laser ablation

Citation
T. Mathews et al., Fabrication of La1-xSrxGa1-yMgyO3-(x plus y)/2 thin films by pulsed laser ablation, SOL ST ION, 135(1-4), 2000, pp. 397-402
Citations number
13
Categorie Soggetti
Apllied Physucs/Condensed Matter/Materiales Science
Journal title
SOLID STATE IONICS
ISSN journal
01672738 → ACNP
Volume
135
Issue
1-4
Year of publication
2000
Pages
397 - 402
Database
ISI
SICI code
0167-2738(200011)135:1-4<397:FOLPYT>2.0.ZU;2-U
Abstract
Sr- and Mg-doped lanthanum gallate, La1-xSrxGa1-yMgyO3-(x+y)/2 (LSGM); of v arious dopant concentrations were prepared by urea/nitrate solution combust ion synthesis. X-ray diffraction patterns indicate that a pure primitive cu bic phase is formed at 1773 K for the compositions La1-xSrxGa1-yMgyO3-(x+y) /2 (0.1 less than or equal tox less than or equal to0.2, 0.1 less than or e qual toy less than or equal to0.2), Thin films of La1-xSrxGa1-yMgyO3-(x+y)/ 2 wen fabricated on quartz and silicon substrates using pulsed-laser ablati on technique. The as-deposited films were amorphous in nature, which on ann ealing at 973 K gave a single-phase cubic structure. As the quality of the film depends on the chemistry of the laser-induced plasma species, the in-s itu determination of the plasma species identities and their relative abund ance was carried out using mass spectrometry in-order to optimize the proce ss parameters. (C) 2000 Elsevier Science B.V. All rights reserved.