Spectroscopic examination of two Egyptian masks: A combined method approach

The identification of the materials used in painted works of art is of grea t importance for (art-) historians, conservators and keepers. Total-reflect ion X-Ray Fluorescence analysis (TXRF) as well as Micro-Raman Spectroscopy (MLRS) have been shown to be successful in the identification of the pigmen ts in artefacts, such as mediaeval manuscripts, polychrome sculptures as we ll as panel-, easel- and wall-painting. In this work the advantages of a combined method approach are demonstrated and as a case study, the examination of two classical. Egyptian masks is pr esented. A gentle micro sampling method, which does not leave any visible t race on the artefacts was used and both of the analytical methods, TXRF and MRS, are performed on the same samples, giving complementary information.