Pyroelectric properties of Pb0.9La0.1TiO3 (PLT(10)) thin films on p-doped poly silicon

Citation
Dh. Chang et al., Pyroelectric properties of Pb0.9La0.1TiO3 (PLT(10)) thin films on p-doped poly silicon, FERROELECTR, 247(4), 2000, pp. 241-251
Citations number
15
Categorie Soggetti
Apllied Physucs/Condensed Matter/Materiales Science
Journal title
FERROELECTRICS
ISSN journal
00150193 → ACNP
Volume
247
Issue
4
Year of publication
2000
Pages
241 - 251
Database
ISI
SICI code
0015-0193(2000)247:4<241:PPOP(T>2.0.ZU;2-3
Abstract
Pyroelectric properties of the PLT(10) thin film deposited on a p-doped pol y-Si electrode have been studied by using the static measurement method. Me asurement of the dielectric constant as a function of temperature shows the typical characteristics of a ferroelectric. The dielectric constant reache s a maximum at 295 degreesC, which can be thought of as the Curie temperatu re. The PLT(10) thin film on p-doped poly-Si fabricated in this research sh ows excellent pyroelectric properties. The pyroelectric coefficient and the figures of merit, Fy and FD at room temperature are measured as 5.76x10(-4 )C/m(2)K, 1.17x10(-10)C.cm/J and 0.93x10(-8)C.cm/J, respectively.