Testing problems with sublearning sample complexity

Authors
Citation
M. Kearns et D. Ron, Testing problems with sublearning sample complexity, J COMPUT SY, 61(3), 2000, pp. 428-456
Citations number
13
Categorie Soggetti
Computer Science & Engineering
Journal title
JOURNAL OF COMPUTER AND SYSTEM SCIENCES
ISSN journal
00220000 → ACNP
Volume
61
Issue
3
Year of publication
2000
Pages
428 - 456
Database
ISI
SICI code
0022-0000(200012)61:3<428:TPWSSC>2.0.ZU;2-K
Abstract
We study the problem of determining, for a class of functions H. whether an unknown target function fis contained in H or is "far" from any function i n H. Thus, in contrast to problems of learning, when we must construct a go od approximation to f in H on the basis of sample data, in problems of test ing we are only required to determine the existence of a good approximation . Our main results demonstrate that, over the domain [0, 1](d) for constant d the number of examples required for testing grows only as O(s(1,2+delta) ) (where delta is any small constant), for both decision trees of size s an d a special class of neural networks with s hidden units. This is in contra st to the Omega (s) examples required for learning these same classes. Our tests are based on combinatorial constructions demonstrating that these cla sses can be approximated by small classes of coarse partitions of space and rely on repeated application of the well-known birthday paradox. (C) 2000 Academic Press.