Re. Stoller et Sj. Zinkle, On the relationship between uniaxial yield strength and resolved shear stress in polycrystalline materials, J NUCL MAT, 283, 2000, pp. 349-352
Attempts to correlate radiation-induced microstructural changes with change
s in mechanical properties rely on a well-established theory to compute the
resolved shear stress required to move dislocations through a field of obs
tacles. However, this microstructure-based shear stress must be converted t
o an equivalent uniaxial tensile stress in order to make comparisons with m
echanical property measurements. A review of the radiation effects literatu
re indicates that there is some confusion regarding the choice of this conv
ersion factor for polycrystalline specimens. Some authors have used values
of 1.73 and 2.0, based on an inappropriate application of the von Mises and
Tresca yield criteria, respectively. The basic models pertinent to this ar
ea of research are reviewed, and it is concluded that the Taylor factor wit
h a Value of 3.06 is the correct parameter to apply in such work. (C) 2000
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