C. Kim et al., Cathodoluminescence characteristics of large-scale in-rich InGaN grains and effect of low-energy electron-beam irradiation, J KOR PHYS, 37(6), 2000, pp. 846-849
GaN and InGaN single-layer and InGaN/GaN multi-quantum-well (MQW) structure
s were grown in sequence on sapphire (0001) substrates by using metalorgani
c chemical vapor deposition, and the luminescence characteristics: of each
layer were investigated employing room-temperature cathodoluminescence (CL)
. Large-scale In-rich grains several microns in width were observed in the
monochromatic CL image, presumably formed at the InGaN MQW layer. The CL sp
ectra measured at In-rich grains showed a slight red-shift and an enhanced
peak intensity. The effect of low-energy electron beam irradiation on the l
uminescence characteristics of each layer was investigated, and a monotonic
decrease of the peak intensity was observed as a function of the irradiati
on dose. The reduction ratio of the normalized integrated intensity due to
irradiation damage was found to be lower in In-rich InGaN than in GaN.