Sy. Chiu et al., Characterization of additive systems for damascene Cu electroplating by the superfilling profile monitor, J VAC SCI B, 18(6), 2000, pp. 2835-2841
Gap-filling dynamics of several different species of additives for copper e
lectrodeposition was investigated by monitoring the cross section of a part
ially filled copper profile on the scanning electron microscopy photo. The
filling ration Deltay/Deltax between "bottom-up" with "sidewall shift" was
found to be proportional to the filing power of additives. The adsorption-d
iffusion model combined with cathode polarization and cyclic voltammetric s
tripping measurements was employed to explain the attribution of additives
in superfilling phenomena. The superfilling dynamics was achieved under beh
avior of additives providing selective inhibition gradient within the damas
cene feature. By means of those analyses, we have optimized the appropriate
amount of additives and achieved the superfilling performance for 0.15 mum
vias with aspect ratio 6 by an acid-copper electrolyte with polyethylene g
lycol, Cl-, and 2-mercaptopyridine (2-MP). Due to the additive of 2-MP, che
late formed which enhanced adsorption ability on Cu-0 surface, and the conc
entration gradient between side-wall shift and bottom-up in the damascene b
ecame high enough to attend superfilling electroplating. (C) 2000 American
Vacuum Society. [S0734-211X(00)13506-1].