We present our results in the design and development of a multiple-beam x-r
ay pattern generator based on an array of Fresnel zone plates (FZPs). Expos
ures have been carried out using a synchrotron source at SuperACO (France),
a PC-controlled piezoelectric scanning stage; and an array of FZPs fabrica
ted by high resolution electron-beam lithography and reactive-ion etching o
f a tungsten absorber. In particular, we have implemented an array of apert
ures using a self-aligned process in order to minimize background intensity
coming from diffraction orders other than the positive fil st order. We sh
ow that even with polychromatic synchrotron radiation and relatively low re
solution FZPs, patterns of various geometries could be successfully written
in poly(methylmethyacrylate) resist and submicrometer resolution was obtai
ned after metal liftoff. (C) 2000 American Vacuum Society. [S0734-211X(00)1
1506-9].