Characterization of mullite/ZrO2 toughness ceramic materials microstructure by medium voltage analytical electron microscopy

Authors
Rincon, JM Romero, M
Citation
Jm. Rincon et M. Romero, Characterization of mullite/ZrO2 toughness ceramic materials microstructure by medium voltage analytical electron microscopy, MATER CHAR, 45(2), 2000, pp. 117-123
Citations number
13
Categorie Soggetti
Material Science & Engineering
Journal title
MATERIALS CHARACTERIZATION
ISSN journal
10445803 → ACNP
Volume
45
Issue
2
Year of publication
2000
Pages
117 - 123
Database
ISI
SICI code
1044-5803(200008)45:2<117:COMTCM>2.0.ZU;2-S
Abstract
A series of mullite/ZrO2 and mullite/alumina/ZrO2 high-toughness ceramic ma terials have been examined by analytical electron microscopy (AEM) at 300 k V and by using the following techniques: energy dispersive X-ray (EDX) micr oanalysis, microdiffraction and convergent beam electron diffraction (CBED) . The relative advantages and disadvantages for the analysis at higher volt ages on the investigation of advanced ceramics are compared with results ob tained at 120 kV. (C) 2000 Elsevier Science Inc. All rights reserved.