Flux growth and characterization of the relaxer-based Pb[(Zn1/3Nb2/3)(1-x)Ti-x]O-3 [PZNT] piezocrystals

Citation
L. Zhang et al., Flux growth and characterization of the relaxer-based Pb[(Zn1/3Nb2/3)(1-x)Ti-x]O-3 [PZNT] piezocrystals, MAT SCI E B, 78(2-3), 2000, pp. 96-104
Citations number
37
Categorie Soggetti
Apllied Physucs/Condensed Matter/Materiales Science","Material Science & Engineering
Journal title
MATERIALS SCIENCE AND ENGINEERING B-SOLID STATE MATERIALS FOR ADVANCED TECHNOLOGY
ISSN journal
09215107 → ACNP
Volume
78
Issue
2-3
Year of publication
2000
Pages
96 - 104
Database
ISI
SICI code
0921-5107(200012)78:2-3<96:FGACOT>2.0.ZU;2-5
Abstract
Relaxer ferroelectric-based single crystals (1 - x)Pb(Zn1/3Nb2/3)O-3-xPbTiO (3) [PZNT] (x = 0 and 0.09) were grown from high temperature solutions, usi ng PbO or PbO/deltaB(2)O(3) as flux. The optimum flux compositions and conc entrations were found to be 50 wt.% PbO and (49 wt.% PbO + 1 wt.% B2O3). It has been shown that addition of up to 1 wt.% B2O3 can stabilize the perovs kite phase and improve the effectiveness of the flux. The optimum thermal p rofile consists of a soaking temperature at 1100 degreesC and a gradually i ncreasing cooling rate from 2 to 5 degreesC min(-1). The spontaneous nuclea tion process could be significantly modified by top-seeding technique. The crystal morphology was studied and related to a layer growth mechanism cont rolled by two-dimensional growth, and to the formation of pyramidal growth sectors. The phase analysis, the morphotropic domain structures and phase t ransitions, and the dielectric properties of the grown PZNT crystals were c haracterized by X-ray powder diffraction, polarized light microscopy and di electric spectroscopy. (C) 2000 Elsevier Science S.A. All rights reserved.