Application of I-DDQ test in failure analysis of micro-controller devices

Authors
Wong, MWT Yu, AMF Li, CK
Citation
Mwt. Wong et al., Application of I-DDQ test in failure analysis of micro-controller devices, MICROELEC J, 32(1), 2001, pp. 29-34
Citations number
7
Categorie Soggetti
Eletrical & Eletronics Engineeing
Journal title
MICROELECTRONICS JOURNAL
ISSN journal
00262692 → ACNP
Volume
32
Issue
1
Year of publication
2001
Pages
29 - 34
Database
ISI
SICI code
0026-2692(200101)32:1<29:AOITIF>2.0.ZU;2-R
Abstract
This paper presents a real case study on the testing of 8-bit mixed-signal CMOS micro-controller devices by applying the I-DDQ testing methodology. Th e aim of the study is to evaluate the feasibility of using the I-DDQ test t o enhance the overall fault coverage. Failure analysis operated on the fail ed sample indicated a good correlation between the fault coverage and the p arts that failed the I-DDQ test. (C) 2000 Elsevier Science Ltd. All rights reserved.