Pulse responses for high-speed nondestructive readout in ferroelectric
s have been studied using a ferroelectric lead zirconate titanate thin
film as a memory capacitor. A critical pulse width t(), defined as t
he maximum of the pulse width for which the system returns to the init
ial polarization state after the removal of the applied pulse field. i
s found to exist, suggesting the possibility of a nondestructive reado
ut in ferroelectric memory. The observed pulse responses are compared
with those of circuit simulation.