The influence of multiple-exposure recording on curvature pattern using multi-aperture speckle shear interferometry

Authors
Mohan, NK
Citation
Nk. Mohan, The influence of multiple-exposure recording on curvature pattern using multi-aperture speckle shear interferometry, OPT COMMUN, 186(4-6), 2000, pp. 259-263
Citations number
9
Categorie Soggetti
Apllied Physucs/Condensed Matter/Materiales Science","Optics & Acoustics
Journal title
OPTICS COMMUNICATIONS
ISSN journal
00304018 → ACNP
Volume
186
Issue
4-6
Year of publication
2000
Pages
259 - 263
Database
ISI
SICI code
0030-4018(200012)186:4-6<259:TIOMRO>2.0.ZU;2-F
Abstract
A method based on multiple exposures in binomial mode of recording and its influence on curvature pattern is presented in this paper. Since the curvat ure information is obtained as a beat moire between two sets of slope patte rns, the multiple-exposure technique proposed in this paper can be implemen ted to sharpen the background slope fringes to enhance the visibility of th e curvature fringes. (C) 2000 Published by :Elsevier Science B.V.