Mc. Cyrille et al., Effect of sputtering pressure-induced roughness on the microstructure and the perpendicular giant magnetoresistance of Fe/Cr superlattices, PHYS REV B, 62(22), 2000, pp. 15079-15083
We have studied the connection between structure and magnetism of Fe/Cr sup
erlattices as a function of sputtering pressure. To measure the perpendicul
ar giant magnetoresistance, we have fabricated microstructured Fe/Cr pillar
s embedded in SiO2 and interconnected with Nb electrodes. Because of the un
iform current distribution in the Nb electrodes and the minimization of the
superlattice-electrode contact resistance, the method allows a simple and
independent measurement of the perpendicular superlattice resistance and gi
ant magnetoresistance. A detailed quantitative structural analysis by x-ray
diffraction, transmission electron microscopy, and high spatial resolution
electron-energy-loss spectroscopy imaging, was correlated with magnetizati
on and anisotropic magnetotransport properties. Structural characterization
of [Fe(3 nm)/Cr(1.3 nm)](20), superlattices indicate that the roughness in
creases monotonically with pressure. The current perpendicular to the plane
giant magnetoresistance was also found to increase with pressure. This is
interpreted as arising from an enhanced spin-dependent scattering.