Structural and electrical consequences of high dopant levels in the BIMGVOX system

Citation
F. Krok et al., Structural and electrical consequences of high dopant levels in the BIMGVOX system, SOL ST ION, 136, 2000, pp. 119-125
Citations number
25
Categorie Soggetti
Apllied Physucs/Condensed Matter/Materiales Science
Journal title
SOLID STATE IONICS
ISSN journal
01672738 → ACNP
Volume
136
Year of publication
2000
Pages
119 - 125
Database
ISI
SICI code
0167-2738(200011)136:<119:SAECOH>2.0.ZU;2-#
Abstract
The influence of high Mg2+ dopant levels in BIMGVOX, Bi2MgxV1-xO5.5-3x/2 (0 .05 less than or equal tox less than or equal to0.40) on structure and cond uctivity has been investigated using X-ray powder diffraction and a.c. impe dance spectroscopy. Four, compositionally dependent. structural ranges are observed at room temperature, with emergence of a new orthorhombic phase at high dopant levels. Generally the Arrhenius plots of conductivity show two linear regions the limits of which an compositionally dependent. The resul ts have been correlated to the stability ranges of various polymorphs withi n the system. (C) 2000 Elsevier Science B.V. All rights reserved.