Economic design of Dodge-Romig lot tolerance per cent defective single sampling plans for variables under Taguchi's quality loss function

Authors
Chen, CH Chou, CY
Citation
Ch. Chen et Cy. Chou, Economic design of Dodge-Romig lot tolerance per cent defective single sampling plans for variables under Taguchi's quality loss function, TOT QUAL M, 12(1), 2001, pp. 5-11
Citations number
8
Categorie Soggetti
Management
Journal title
TOTAL QUALITY MANAGEMENT
ISSN journal
09544127 → ACNP
Volume
12
Issue
1
Year of publication
2001
Pages
5 - 11
Database
ISI
SICI code
0954-4127(200101)12:1<5:EDODLT>2.0.ZU;2-B
Abstract
The purpose of this paper is to present the problem of the design of integr ating Dodge-Romig lot tolerance per cent defective (LTPD) single sampling p lans (SSP) for variables and specification limits. Considering that the qua lity characteristic obeys a normal distribution, we propose a modification of Kapur and Wang's model for obtaining the optimal inspection policy of Do dge-Romig LTPD SSP for variables.