Focused ion beam in dental research

Focused ion beam (FIB) has been available for over 10 yrs but until recentl y its usage has been confined to the semiconductor industry. It has been de veloped as an important tool in defect analysis, circuit modification and r ecently transmission electron microscope sample preparation. This paper int roduces FIB and demonstrates its application in dental research. Its ion an d electron imaging modes complement the SEM while its ability to prepare TE M samples from a wide range of material will allow the study of new types o f adhesive interface. As an example, its use is described in the characteri zation of the interface of resin to a tribochemically treated surface of an experimental fiber-reinforced resin-based composite. As with all new techn iques, the initial learning curve was difficult to manage. This new instrum ent offers opportunities to expand research in dental materials to areas no t possible before.