Do grain boundaries assist S diffusion in polycrystalline CdS/CdTe heterojunctions?

Citation
Y. Yan et al., Do grain boundaries assist S diffusion in polycrystalline CdS/CdTe heterojunctions?, APPL PHYS L, 78(2), 2001, pp. 171-173
Citations number
19
Categorie Soggetti
Apllied Physucs/Condensed Matter/Materiales Science
Journal title
APPLIED PHYSICS LETTERS
ISSN journal
00036951 → ACNP
Volume
78
Issue
2
Year of publication
2001
Pages
171 - 173
Database
ISI
SICI code
0003-6951(20010108)78:2<171:DGBASD>2.0.ZU;2-H
Abstract
We report on a transmission electron microscopy and energy-dispersive x-ray spectroscopy study of S diffusion in polycrystalline CdS/CdTe heterojuncti ons. We find that grain boundaries significantly assist S diffusion in the CdTe layer when the CdTe is grown without the presence of oxygen, i.e., the S diffuses more easily along the grain boundaries than in the grains. Howe ver, grain boundaries do not enhance the S diffusion in CdTe when it is gro wn in the presence of oxygen. The reason is likely to be the formation of C d-O bonds at the grain boundaries, which are resistance to the S diffusion. (C) 2001 American Institute of Physics.