B. Koley et al., Accelerated and reproducible oxidation of strain-compensated short-period superlattice structures for incorporation in InP based devices, APPL PHYS L, 78(1), 2001, pp. 64-66
An accelerated oxidation process has been demonstrated in InAs/AlAs-based s
train-compensated ultrashort-period superlattices grown on an InP substrate
. It has been observed that the uniformity as well as the rate of the oxida
tion process in the strain-compensated short-period superlattice depends on
the composition of the surrounding semiconductor layers. A suitable layer
structure has been designed to obtain accelerated and reproducible oxidatio
n rate in InP based optoelectronic devices. (C) 2001 American Institute of
Physics.