X-ray phase-contrast imaging with submicron resolution by using extremely asymmetric Bragg diffractions

Authors
Kobayashi, K Izumi, K Kimura, H Kimura, S Ibuki, T Yokoyama, Y Tsusaka, Y Kagoshima, Y Matsui, J
Citation
K. Kobayashi et al., X-ray phase-contrast imaging with submicron resolution by using extremely asymmetric Bragg diffractions, APPL PHYS L, 78(1), 2001, pp. 132-134
Citations number
10
Categorie Soggetti
Apllied Physucs/Condensed Matter/Materiales Science
Journal title
APPLIED PHYSICS LETTERS
ISSN journal
00036951 → ACNP
Volume
78
Issue
1
Year of publication
2001
Pages
132 - 134
Database
ISI
SICI code
0003-6951(20010101)78:1<132:XPIWSR>2.0.ZU;2-#
Abstract
We have obtained x-ray phase-contrast images with high spatial resolution b y using extremely asymmetric Si 111 Bragg diffractions near the critical an gle of the total reflection. The x-ray image could be magnified to 294 time s in both vertical and horizontal directions. By using this x-ray microscop y system, we have observed clear phase-contrast images of a 0.7-mum-wide go ld-line pattern. (C) 2001 American Institute of Physics.