Js. Williams et al., Preferential amorphization and defect annihilation at nanocavities in silicon during ion irradiation, APPL PHYS L, 77(26), 2000, pp. 4280-4282
Si containing a band of nanocavities has been irradiated with Si+ ions at e
levated temperatures to study interactions of irradiation-induced defects w
ith open volume defects. For irradiation at 100 degreesC, nanocavities are
shown to be preferential nucleation sites for amorphization. It is proposed
that this behavior occurs to minimize the local free energy, whereby less
dense amorphous Si is free to expand into the cavity open volume. Furthermo
re, for irradiation at 300 degreesC, cavities are very efficient sinks for
Si interstitials during irradiation, leaving a region denuded of interstiti
al-based clusters surrounding each nanocavity. (C) 2000 American Institute
of Physics. [S0003-6951(00)01552-7].