Preferential amorphization and defect annihilation at nanocavities in silicon during ion irradiation

Citation
Js. Williams et al., Preferential amorphization and defect annihilation at nanocavities in silicon during ion irradiation, APPL PHYS L, 77(26), 2000, pp. 4280-4282
Citations number
18
Categorie Soggetti
Apllied Physucs/Condensed Matter/Materiales Science
Journal title
APPLIED PHYSICS LETTERS
ISSN journal
00036951 → ACNP
Volume
77
Issue
26
Year of publication
2000
Pages
4280 - 4282
Database
ISI
SICI code
0003-6951(200012)77:26<4280:PAADAA>2.0.ZU;2-V
Abstract
Si containing a band of nanocavities has been irradiated with Si+ ions at e levated temperatures to study interactions of irradiation-induced defects w ith open volume defects. For irradiation at 100 degreesC, nanocavities are shown to be preferential nucleation sites for amorphization. It is proposed that this behavior occurs to minimize the local free energy, whereby less dense amorphous Si is free to expand into the cavity open volume. Furthermo re, for irradiation at 300 degreesC, cavities are very efficient sinks for Si interstitials during irradiation, leaving a region denuded of interstiti al-based clusters surrounding each nanocavity. (C) 2000 American Institute of Physics. [S0003-6951(00)01552-7].