Strong interface-induced changes on the numerical calculated Raman scattering in Si/3C-SiC superlattices

Citation
Ef. Bezerra et al., Strong interface-induced changes on the numerical calculated Raman scattering in Si/3C-SiC superlattices, APPL PHYS L, 77(26), 2000, pp. 4316-4318
Citations number
14
Categorie Soggetti
Apllied Physucs/Condensed Matter/Materiales Science
Journal title
APPLIED PHYSICS LETTERS
ISSN journal
00036951 → ACNP
Volume
77
Issue
26
Year of publication
2000
Pages
4316 - 4318
Database
ISI
SICI code
0003-6951(200012)77:26<4316:SICOTN>2.0.ZU;2-#
Abstract
Raman spectra of (3C-SiC)(8-delta)/(3C-SiC0.5Si0.5)(delta)/(Si)(8-delta)/(3 C-SiC0.5Si0.5)(delta) superlattices with interfacial transition regions of thickness delta varying from one to three monolayers are calculated. It is shown that severe frequency shifts (up to -86 cm(-1)) and the flattening of the folded optical phonons dispersion curves are due to the interfacial re gions, strongly affecting the Raman spectrum in consequence. With increasin g interface thickness, the Raman peaks are enhanced in the middle frequency range. These effects are mainly attributed to localization of atomic displ acements at the Si/3C-SiC or the 3C-SiC/Si interfacial transition regions. (C) 2000 American Institute of Physics. [S0003- 6951(00)01948-3].