Hfc. Hoevers et al., Thermal fluctuation noise in a voltage biased superconducting transition edge thermometer, APPL PHYS L, 77(26), 2000, pp. 4422-4424
The current noise at the output of a microcalorimeter with a voltage biased
superconducting transition edge thermometer is studied in detail. In addit
ion to the two well-known noise sources: thermal fluctuation noise from the
heat link to the bath and Johnson noise from the resistive thermometer, a
third noise source strongly correlated with the steepness of the thermomete
r is required to fit the measured noise spectra. Thermal fluctuation noise,
originating in the thermometer itself, fully explains the additional noise
. A simple model provides quantitative agreement between the observed and c
alculated noise spectra for all bias points in the superconducting transiti
on. (C) 2000 American Institute of Physics. [S0003-6951(01)03901-8].