Thermal fluctuation noise in a voltage biased superconducting transition edge thermometer

Citation
Hfc. Hoevers et al., Thermal fluctuation noise in a voltage biased superconducting transition edge thermometer, APPL PHYS L, 77(26), 2000, pp. 4422-4424
Citations number
9
Categorie Soggetti
Apllied Physucs/Condensed Matter/Materiales Science
Journal title
APPLIED PHYSICS LETTERS
ISSN journal
00036951 → ACNP
Volume
77
Issue
26
Year of publication
2000
Pages
4422 - 4424
Database
ISI
SICI code
0003-6951(200012)77:26<4422:TFNIAV>2.0.ZU;2-9
Abstract
The current noise at the output of a microcalorimeter with a voltage biased superconducting transition edge thermometer is studied in detail. In addit ion to the two well-known noise sources: thermal fluctuation noise from the heat link to the bath and Johnson noise from the resistive thermometer, a third noise source strongly correlated with the steepness of the thermomete r is required to fit the measured noise spectra. Thermal fluctuation noise, originating in the thermometer itself, fully explains the additional noise . A simple model provides quantitative agreement between the observed and c alculated noise spectra for all bias points in the superconducting transiti on. (C) 2000 American Institute of Physics. [S0003-6951(01)03901-8].