On the microenvironments surrounding dansyl sequestered within class I andII xerogels

Citation
S. Pandey et al., On the microenvironments surrounding dansyl sequestered within class I andII xerogels, CHEM MATER, 12(12), 2000, pp. 3547-3551
Citations number
72
Categorie Soggetti
Apllied Physucs/Condensed Matter/Materiales Science","Material Science & Engineering
Journal title
CHEMISTRY OF MATERIALS
ISSN journal
08974756 → ACNP
Volume
12
Issue
12
Year of publication
2000
Pages
3547 - 3551
Database
ISI
SICI code
0897-4756(200012)12:12<3547:OTMSDS>2.0.ZU;2-8
Abstract
We report on the static and time-resolved fluorescence spectroscopy of dans yl sequestered within two xerogels that were formed from tetraethylorthosil ane (TEOS) mixed with ppm levels of dansylamide or dansyltriethoxysilane. T hese are referred to as class I and II xerogels, respectively. Experiments were performed on these samples as they progressed from liquids to xerogels over a period of 1 year. The results show that the average local microenvi ronment surrounding the dansyl dopant is different in the class I and II xe rogels. Specifically, even though the dipolarity surrounding the dansyl dop ant increases as both samples progress from liquids to xerogels, the local dansyl microenvironment within a class II xerogel is always more heterogene ous in comparison to the class I xerogel. In an aged xerogel, the local dip olarity surrounding the dansyl dopant is greater for the class I xerogel th an for the class II xerogel. These results are discussed in terms of a mode l that has the dansyl locating preferentially within Si-OH- and SiO2-rich r egions for the class I and II xerogels, respectively.