New study of radiation risk to high fliers

Authors
Bentley, B
Citation
B. Bentley, New study of radiation risk to high fliers, ELECTRO ENG, 72(887), 2000, pp. 35
Categorie Soggetti
Eletrical & Eletronics Engineeing
Journal title
ELECTRONIC ENGINEERING
ISSN journal
00134902 → ACNP
Volume
72
Issue
887
Year of publication
2000
Database
ISI
SICI code
0013-4902(200012)72:887<35:NSORRT>2.0.ZU;2-A