Citation
Xm. Jiang et al., Development of synchrotron radiation X-ray grazing incident diffraction method, HIGH EN P N, 24(12), 2000, pp. 1185-1190
Citations number
8
Categorie Soggetti
Physics
Journal title
HIGH ENERGY PHYSICS AND NUCLEAR PHYSICS-CHINESE EDITION
ISSN journal
02543052
→ ACNP
Volume
24
Issue
12
Year of publication
2000
Pages
1185 - 1190
Database
ISI
SICI code
0254-3052(200012)24:12<1185:DOSRXG>2.0.ZU;2-D
Abstract
Synchrotron radiation X-ray grazing incident diffraction (GID) method was d
eveloped based on the five-circle diffractometer in the Diffuse Scattering
Station at Beijing Synchrotron Radiation Facility. The lateral strain induc
ed by the Ge/Si quantum dotswas measured successfully, which showed the cap
ability of the GID method in measuring weak signals from surface structures
. The results showed that the formation of Ge/Si quantum dots caused both t
he lateral expansion-strain and contraction-strain in the surface layer of
Si(001) substrate.