Effectiveness of microarchitecture test program generation

Authors
Utamaphethai, N Blanton, RDS Shen, JP
Citation
N. Utamaphethai et al., Effectiveness of microarchitecture test program generation, IEEE DES T, 17(4), 2000, pp. 38-49
Citations number
18
Categorie Soggetti
Computer Science & Engineering
Journal title
IEEE DESIGN & TEST OF COMPUTERS
ISSN journal
07407475 → ACNP
Volume
17
Issue
4
Year of publication
2000
Pages
38 - 49
Database
ISI
SICI code
0740-7475(200010/12)17:4<38:EOMTPG>2.0.ZU;2-V
Abstract
Investigation of a list of design errors typically encountered in industry is undertaken to determine if our microarchitecture test programs can detec t them. Two metrics, functional and timing deviation are used to determine design error coverage.