Complementary aspects of X-ray absorption spectroscopy and anomalous diffraction in the case of light-oxide-supported nanomaterials

Citation
R. Revel et al., Complementary aspects of X-ray absorption spectroscopy and anomalous diffraction in the case of light-oxide-supported nanomaterials, J PHYS IV, 10(P10), 2000, pp. 289-297
Citations number
9
Categorie Soggetti
Physics
Journal title
JOURNAL DE PHYSIQUE IV
ISSN journal
11554339 → ACNP
Volume
10
Issue
P10
Year of publication
2000
Pages
289 - 297
Database
ISI
SICI code
1155-4339(200009)10:P10<289:CAOXAS>2.0.ZU;2-O
Abstract
The complementarity of two techniques related to synchrotron radiation, the X-ray absorption spectroscopy and the anomalous diffraction is shown throu gh the study of a complex material which can be used for different purposes (ionic conductivity, catalysis...) is developped. For nanometric supported oxide clusters, such approach is able to give an accurate structural descr iption including a precise measure of the occupation octahedral site by cat ions as well as the size of the nanometer scale cristallite.