R. Revel et al., Complementary aspects of X-ray absorption spectroscopy and anomalous diffraction in the case of light-oxide-supported nanomaterials, J PHYS IV, 10(P10), 2000, pp. 289-297
The complementarity of two techniques related to synchrotron radiation, the
X-ray absorption spectroscopy and the anomalous diffraction is shown throu
gh the study of a complex material which can be used for different purposes
(ionic conductivity, catalysis...) is developped. For nanometric supported
oxide clusters, such approach is able to give an accurate structural descr
iption including a precise measure of the occupation octahedral site by cat
ions as well as the size of the nanometer scale cristallite.