Application of X-ray diffraction to thermal analysis

Citation
W. Engel et al., Application of X-ray diffraction to thermal analysis, J PHYS IV, 10(P10), 2000, pp. 497-504
Citations number
23
Categorie Soggetti
Physics
Journal title
JOURNAL DE PHYSIQUE IV
ISSN journal
11554339 → ACNP
Volume
10
Issue
P10
Year of publication
2000
Pages
497 - 504
Database
ISI
SICI code
1155-4339(200009)10:P10<497:AOXDTT>2.0.ZU;2-A
Abstract
X-ray diffraction was used for thermal analysis. Series of diffraction patt erns were measured, while the samples were heated/cooled stepwise or isothe rmally with freely selectable temperature programs. The method was applied for the investigation of the phase transitions of am monium nitrate, when the identification of phases is required. Its capabili ties in the field of kinetics are demonstrated with the isothermal investig ation of the solid state reaction of ammonium nitrate with copper oxide, wh ich was performed by means of a difference procedure. An example for the ap plication in high temperature research is given with the oxidation of MoSi2 , where the occurring phases during oxidation were identified. For obtainin g dilatometric data Rietveld refinement was applied for the investigation o f ammonium nitrate.