Characterization and minimization of flicker in silicon light valves

We have performed systematic characterizations of flicker in silicon light valves. It was found that there were four conduction mechanisms accounting for the flicker. These four mechanisms were residual dc charge on the silic on surface, voltage holding capability of the liquid crystal cell, voltage holding capability of the silicon panel, and parasitic capacitor coupling o f the pixel. Major causes of these four mechanisms were identified. Solutio ns of flicker minimization were obtained for each mechanism. Among these so lutions, offset of common voltage was found very useful to compensate for r esidual dc charge and parasitic capacitor coupling. Frame rate multiplicati on was found very useful for the minimization of flicker due to low voltage holding capabilities of the liquid crystal cell and silicon panel. (C) 200 1 American Institute of Physics.