Photoresist etching in an inductively coupled, traveling wave driven, large area plasma source

Citation
K. Takechi et Ma. Lieberman, Photoresist etching in an inductively coupled, traveling wave driven, large area plasma source, J APPL PHYS, 89(2), 2001, pp. 869-877
Citations number
22
Categorie Soggetti
Apllied Physucs/Condensed Matter/Materiales Science
Journal title
JOURNAL OF APPLIED PHYSICS
ISSN journal
00218979 → ACNP
Volume
89
Issue
2
Year of publication
2001
Pages
869 - 877
Database
ISI
SICI code
0021-8979(20010115)89:2<869:PEIAIC>2.0.ZU;2-U
Abstract
We report on experimental and modeling results for photoresist etching with oxygen gas in an inductively coupled large area plasma source (LAPS). The source is driven by a 13.56 MHz traveling wave launched along a serpentine antenna embedded in the plasma and has a processing area as large as 40 cmx 50 cm. We describe a new series-parallel antenna coil configuration, and we present experimental observations for oxygen plasma density profiles, phot oresist etch rates, and etch profiles. We introduce a simplified spatially varying oxygen discharge model corresponding to a two-dimensional LAPS geom etry in order to account for the generation and loss of both etchant atoms (O atoms) and bombarding ions. The model and experimental results on plasma density are compared. A simplified photoresist etch kinetics model combine d with the spatially varying oxygen discharge model is then described. The ion flux and O-atom density predicted by the model are compared with the et ch rate data. In order to gain insight into the underlying physical mechani sm, we also compare the data with the scaling behavior of the etch rates pr edicted by a volume-averaged (global) oxygen discharge model. The models an d experimental results are generally in good agreement. (C) 2001 American I nstitute of Physics.