Z. Kighelman et al., Electromechanical properties and self-polarization in relaxor Pb(Mg1/3Nb2/3)O-3 thin films, J APPL PHYS, 89(2), 2001, pp. 1393-1401
Pyrochlore free Pb(Mg1/3Nb2/3)O-3 (PMN) thin films were prepared from alkox
ide-based solution precursors. The influence of different seeding layers an
d chemical solution on the microstructures is shown. Dielectric, electrostr
ictive, and piezoelectric properties of the films were characterized in det
ail. Films show relaxor-like behavior, but with dielectric permittivity whi
ch is low (around 4000 at peak) compared to bulk ceramics and single crysta
ls. Several parameters which might be responsible for this lower permittivi
ty are suggested. Electrostrictive coefficients, M and Q, were determined b
y measuring strain S and polarization P as a function of the electric field
(E-ac). At large fields (>2.6x10(6) V/m), S vs P-2 appears to deviate from
linear behavior possibly suggesting that the electrostrictive coefficient
Q becomes nonlinear in this field range. Investigated as-prepared PMN films
exhibit piezoelectric response in the absence of a dc electric field (d(33
)=8-20 pm/V). The value of the associated self-polarization in the films is
estimated and its presence confirmed by zero-field pyroelectric measuremen
ts. The self-polarization and the piezoelectric coefficient are strong func
tions of the ac field amplitude. Asymmetry of S vs E-ac and d(33) vs E-dc l
oops are related to the self-polarization. An ac field induces shift in P v
s E loops along the field axis. This increase in the coercive field is asso
ciated, through a simple model, with the presence of the self-polarization.
(C) 2001 American Institute of Physics.