Je. Gerbi et Jr. Abelson, Deposition of microcrystalline silicon: Direct evidence for hydrogen-induced surface mobility of Si adspecies, J APPL PHYS, 89(2), 2001, pp. 1463-1469
Hydrogenated microcrystalline silicon thin films can be deposited at low su
bstrate temperatures using plasma enhanced-or hot wire-chemical vapor depos
ition using silane, reactive magnetron sputtering of silicon, or related te
chniques. Microcrystalline silicon is deposited when a large quantity of mo
lecular hydrogen is added to the process gas such that a large flux of atom
ic hydrogen impinges on the film growth surface; otherwise, the films are a
morphous. Three different microscopic mechanisms have been hypothesized to
explain the formation of the microcrystalline phase. In essence, the hypoth
eses are that atomic hydrogen: (i) enhances the surface diffusion of Si ads
pecies, which in turn raises the probability of crystalline phase formation
, (ii) promotes a subsurface transformation of amorphous into microcrystall
ine Si, or (iii) preferentially etches amorphous regions such that only mic
rocrystalline Si survives to produce film growth. In this work, we critical
ly test mechanism (i) as follows. We deposit films using dc reactive magnet
ron sputtering of a Si target in an argon-hydrogen plasma, which yields ver
y poor adspecies mobility at low rates of hydrogen injection. We then incre
ase the hydrogen injection and measure the increase in adspecies motion via
the enhanced rate at which the surface smoothens for film growth on substr
ates with a calibrated roughness of similar to 80 Angstrom. The dynamic sur
face roughness and the structural phase are determined by real-time spectro
scopic ellipsometry. The combination of high atomic hydrogen flux and high
surface hydrogen coverage uniquely correlates with microcrystalline phase f
ormation. Higher substrate temperatures do not increase adspecies mobility,
and actually decrease it when the rate of thermal desorption becomes suffi
cient to decrease the surface hydrogen coverage. These results also suggest
that the original identity of the Si-bearing growth species is relatively
unimportant, because the atomic hydrogen flux appears to produce mobile ads
pecies via surface reactions. We have previously shown that subsurface tran
sformations, mechanism (ii), can also occur. However, we find no evidence f
or competitive etching, mechanism (iii), under our experimental conditions.
(C) 2001 American Institute of Physics.