Fluorescence extended x-ray absorption fine structure study on local structures around Mn atoms in thin (In, Mn)As layer and (In, Mn)As quantum dots

Citation
H. Ofuchi et al., Fluorescence extended x-ray absorption fine structure study on local structures around Mn atoms in thin (In, Mn)As layer and (In, Mn)As quantum dots, J APPL PHYS, 89(1), 2001, pp. 66-70
Citations number
16
Categorie Soggetti
Apllied Physucs/Condensed Matter/Materiales Science
Journal title
JOURNAL OF APPLIED PHYSICS
ISSN journal
00218979 → ACNP
Volume
89
Issue
1
Year of publication
2001
Pages
66 - 70
Database
ISI
SICI code
0021-8979(20010101)89:1<66:FEXAFS>2.0.ZU;2-U
Abstract
We have investigated thin (In, Mn)As layer and (In, Mn)As quantum dots (wit h Mn mole fraction lower than 0.02) on GaAs(001) by fluorescence extended x -ray absorption fine structure (EXAFS) in order to study the local structur es formed around the Mn atoms. The EXAFS analysis revealed that in a 10 nm thick (In, Mn)As layer, the In-site substitutional Mn and the NiAs-type MnA s coexisted, while the majority of the Mn atoms were substituted in the In- sites of InAs in (In, Mn)As quantum dots. It is considered that different g rowth modes for the thin layer and the quantum dots affect the local struct ures. (C) 2001 American Institute of Physics.