Transient electron transport in indium-doped semiinsulating GaAs

Citation
V. Kazukauskas et al., Transient electron transport in indium-doped semiinsulating GaAs, J APPL PHYS, 89(1), 2001, pp. 557-560
Citations number
22
Categorie Soggetti
Apllied Physucs/Condensed Matter/Materiales Science
Journal title
JOURNAL OF APPLIED PHYSICS
ISSN journal
00218979 → ACNP
Volume
89
Issue
1
Year of publication
2001
Pages
557 - 560
Database
ISI
SICI code
0021-8979(20010101)89:1<557:TETIIS>2.0.ZU;2-2
Abstract
We investigated the effect of In-doping up to a concentration of 2 x 10(20) cm(-3) on transient transport phenomena in semiinsulating liquid-encapsula ted-Czochralski grown GaAs. The changes in time after a strong laser excita tion of the photoconductivity and nonequilibrium Hall mobility were analyze d. We did not find extra energy levels caused by indium. Nevertheless, In-d oping caused significant changes in the behavior of the nonequilibrium mobi lity in the temperature range of 300-420 K, which were not observed in othe r crystals, undoped or doped by other dopants. They could not be explained merely by the reduction of dislocation density caused by In. Besides, the I n-doping was demonstrated to cause the rearrangement of defect inhomogeneit ies. It is considered that lattice defects become distributed more homogene ously and appear more probably as short-range inhomogeneities instead of ac cumulations around dislocations. This diminishes the role of percolation ph enomena and intensifies the effect of smaller defects on carrier transport. (C) 2001 American Institute of Physics.