Test and diagnosis of electric circuitry by IR thermal imaging

Citation
Xj. Chen et al., Test and diagnosis of electric circuitry by IR thermal imaging, J INF M W, 19(6), 2000, pp. 463-466
Citations number
3
Categorie Soggetti
Apllied Physucs/Condensed Matter/Materiales Science
Journal title
JOURNAL OF INFRARED AND MILLIMETER WAVES
ISSN journal
10019014 → ACNP
Volume
19
Issue
6
Year of publication
2000
Pages
463 - 466
Database
ISI
SICI code
1001-9014(200012)19:6<463:TADOEC>2.0.ZU;2-3
Abstract
A model of IR thermal diagnosis for electric circuitry was established. The temperature profile on the circuitry surface was measured by a thermal vid eo system. And then the inner metallic conductor's temperature was calculat ed through the developed model to find hidden troubles of malfunction and f ire in early stage. A model simulating the different running conditions of the circuitry was also developed to extend the application scope.