We report on a broadband technique for making frequency-swept permeability
measurements of magnetic thin films, The device is essentially a strip line
short circuited to the ground plane. The measurement of the input impedanc
e of the cell loaded with the sample is modeled appropriately with an equiv
alent electrical circuit and the complex permeability is deduced. The techn
ique is applied in deducing the complex permeability of thin permalloy film
s deposited on Si(1 0 0) substrates in the frequency range from 200 MHz to
4 GHz. (C) 2000 Elsevier Science B.V. All rights reserved.